| 2025-10-29 |
KLLMJP1155232 |
TOKYO ELECTRON LIMITED |
18092.0 kg |
50900.0
|
MACHINE:CELLESTA-I MD . ORIGIN: JAPAN HS CODE: . . . . MACHINE:CELLESTA-I MD . ORIGIN: JAPAN HS CODE: . . . . MACHINE:CELLESTA-I MD . ORIGIN: JAPAN HS CODE: . . . . MACHINE:CELLESTA-I MD . ORIGIN: JAPAN HS CODE: . . . . |
| 2025-10-15 |
KLLMJP1154401 |
MICRON MEMORY JAPAN K K |
4980.0 kg |
401693.0
|
FULL AUTO PROBER (UF EX-I , ARTS-WR PLUS) IC MEMORY TESTER(C D TESTER) PO NO. - , SHIPDOC NO. HS CODE : . |
| 2025-09-17 |
KLLMSG2552910 |
MICRON SEMICONDUCTOR ASIA OPERATION |
10601.0 kg |
|
HIKE_AA _PLY_ BD HIKE_AA _PLY_ BD HIKE_AA _PLY_ BD |
| 2025-09-11 |
KLLMJP1153432 |
MICRON MEMORY JAPAN K K |
15500.0 kg |
511211.0
|
E _ - DNS_SU _DHFIPA_ , SU- MICRON PART#: POL: N A . ECCN NUMBER LICENSE: - NLR . +ATTN:[email protected] E _ - DNS_SU _DHFIPA_ , SU- MICRON PART#: POL: N A . ECCN NUMBER LICENSE: - NLR . +ATTN:[email protected] E _ - DNS_SU _DHFIPA_ , SU- MICRON |
| 2025-09-06 |
KLLMSG2501240 |
MICRON SEMICONDUCTOR ASIA OPS PTE |
1929.0 kg |
847989.0
|
GAS BOXES AND GIB (PART OF A SEMICONDUCTOR EQUIPMENT) |
| 2025-09-02 |
KLLMJP1151909 |
MICRON MEMORY JAPAN K K |
4980.0 kg |
401693.0
|
FULL AUTO PROBER (UF EX,MHF EX,ARTS-WR PLUS) . . IC MEMORY TESTER(C D TESTER) . . PO NO. SHIPDOC NO. . . + - - |
| 2025-09-02 |
KLLMJP1151948 |
MICRON MEMORY JAPAN K K |
10200.0 kg |
901041.0
|
SEMICONDUCTOR EQUIPMENT CONFIG, TM, SHIP WITH, ( E ATM, VTM) . ASSY, PM KIYO FX (KIYO FXE - CHAMBERS) . . PO NO. SHIPDOC NO. . . . ++MANASSAS VA UNITED STATES + ( ) - , + ( ) - + ( ) - , + ( ) - SEMICONDUCTOR EQUIPMENT CONFIG, TM, SHIP WITH, ( E ATM, |
| 2025-08-26 |
KLLMJP1152608 |
MICRON MEMORY JAPAN K K |
20400.0 kg |
290544.0
|
FULL AUTO PROBER (UF EX-I , ARTS-WR PLUS) F MN IC MEMORY TESTER (C D TESTER) - IC MEMORY TESTER (C D TESTER) IC MEMORY TESTER (C D TESTER) IC MEMORY TESTER (C D TESTER) IC MEMORY TESTER (C D TESTER) PO NO. SHIPDOC NO. HS CODE : . FULL AUTO PROBER (UF |
| 2025-08-16 |
KLLMJP1152362 |
MICRON MEMORY JAPAN K K |
257.0 kg |
845730
|
001 4HV REFLKP7Z CHILLER TRANSFER TO F6 . PO#4515302063-2 SHIPDOC NO.2007420 |
| 2025-08-16 |
KLLMJP1152361 |
MICRON MEMORY JAPAN K K |
16485.0 kg |
981800
|
001 CMP EQUIPMENT(REFLEXION LKP) . . PO#4515302063-1 SHIPDOC NO.2013979 001 CMP EQUIPMENT(REFLEXION LKP) . . PO#4515302063-1 SHIPDOC NO.2013979 |
| 2025-06-12 |
KLLMJP1148562 |
MICRON MEMORY JAPAN HIROSHIMA |
1430.0 kg |
851140
|
002 ABATEMENT FOR 1957044 BURN WET SCRUBBER GAIA-I DUAL . |
| 2025-06-03 |
KLLMJP1148533 |
MURATA MACHINERY LTD |
4660.0 kg |
870530
|
SRC330X VEHICLES . . . . . . . . . |
| 2025-06-01 |
KLLMSG2546471 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
17201.0 kg |
846610
|
MICAP 1522344 TOOL, TEL VISRK5 MICAP 1522344 TOOL, TEL VISRK5 MICAP 1522344 TOOL, TEL VISRK5 MICAP 1522344 TOOL, TEL VISRK5 |
| 2025-05-30 |
KLLMJP1148870 |
MURATA MACHINERY LTD |
15300.0 kg |
870530
|
SRC330X VEHICLES SRC330X VEHICLES SRC330X VEHICLES |
| 2025-05-17 |
KLLMSG2546472 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
16634.0 kg |
903180
|
SEMICONDUCTOR EQUIPMENT (1367931, LAM FLEXHX - E4082) SEMICONDUCTOR EQUIPMENT (1367931, LAM FLEXHX - E4082) SEMICONDUCTOR EQUIPMENT (1367931, LAM FLEXHX - E4082) SEMICONDUCTOR EQUIPMENT (1367931, LAM FLEXHX - E4082) |
| 2025-05-10 |
KLLMJP1148395 |
MICRON MEMORY JAPAN K K |
9190.0 kg |
050900
|
001 HIKE QULN HQSIO E4052 DJ-1236VN-DF ORIGIN: JP ECCN NUMBER LICENSE: - NLR . PO#4515060278-1 001 HIKE QULN HQSIO E4052 DJ-1236VN-DF ORIGIN: JP ECCN NUMBER LICENSE: - NLR . PO#4515060278-1 |
| 2025-04-16 |
KLLMJP1146604 |
MICRON MEMORY JAPAN K K |
20550.0 kg |
903082
|
001 C1D TESTER(SIG C1D, E4450-A) 592-10475 002 C1D TESTER(SIG C1D, E4450-B) 003 C1D TESTER(SIG C1D, E4450-C) 004 C1D TESTER(SIG C1D, E4450-D) 005 C1D TESTER(SIG C1D, E4450-E) 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4450-F) F72002MM PO NO.4514889964 SHI |
| 2025-04-09 |
KLLMJP1146426 |
MICRON MEMORY JAPAN K K |
4980.0 kg |
903082
|
001 C1D TESTER(SIG C1D, E4855-B) 592-10475 . 002 FULL AUTO PROBER (ACCRETECH UF3000EX, E4855-A) F72002MM . . PO NO.4514859922 SHIPDOC NO.1961522 HS CODE :9030.82 |
| 2025-04-09 |
KLLMJP1146563 |
MICRON MEMORY JAPAN K K |
19180.0 kg |
903082
|
001 C1D TESTER(SIG C1D, E4257-B) 592-10475 ORIGIN: US . 002 C1D TESTER(SIG C1D, E4257-C) . 003 C1D TESTER(SIG C1D, E4257-D) . 004 C1D TESTER(SIG C1D, E4257-E) . 005 C1D TESTER(SIG C1D, E4257-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4257-A) F72002MM |
| 2025-04-02 |
KLLMJP1145925 |
MICRON MEMORY JAPAN K K |
18750.0 kg |
903082
|
001 C1D TESTER(SIG C1D, E4258-B) 592-10475 ORIGIN: US . 002 C1D TESTER(SIG C1D, E4258-C) . 003 C1D TESTER(SIG C1D, E4258-D) . 004 C1D TESTER(SIG C1D, E4258-E) . 005 C1D TESTER(SIG C1D, E4258-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4258-A) F72002MM |
| 2025-02-20 |
KLLMJP1145514 |
MICRON MEMORY JAPAN K K |
20550.0 kg |
290544
|
001 C1D TESTER(SIG C1D, E4451-B) 592-10475 . 002 C1D TESTER(SIG C1D, E4451-C) . 003 C1D TESTER(SIG C1D, E4451-D) . 004 C1D TESTER(SIG C1D, E4451-E) . 005 C1D TESTER(SIG C1D, E4451-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4451-A) F72002MM . PO NO.4514766415 SHIPDOC NO.1955183 001 C1D TESTER(SIG C1D, E4451-B) 592-10475 . 002 C1D TESTER(SIG C1D, E4451-C) . 003 C1D TESTER(SIG C1D, E4451-D) . 004 C1D TESTER(SIG C1D, E4451-E) . 005 C1D TESTER(SIG C1D, E4451-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4451-A) F72002MM . PO NO.4514766415 SHIPDOC NO.1955183 001 C1D TESTER(SIG C1D, E4451-B) 592-10475 . 002 C1D TESTER(SIG C1D, E4451-C) . 003 C1D TESTER(SIG C1D, E4451-D) . 004 C1D TESTER(SIG C1D, E4451-E) . 005 C1D TESTER(SIG C1D, E4451-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4451-A) F72002MM . PO NO.4514766415 SHIPDOC NO.1955183 |
| 2025-01-10 |
KLLMJP1142444 |
MICRON MEMORY JAPAN K K |
20550.0 kg |
903082
|
001 C1D TESTER(SIG C1D, E4255-B) 592-10475 ORIGIN: US . 002 C1D TESTER(SIG C1D, E4255-C) . 003 C1D TESTER(SIG C1D, E4255-D) . 004 C1D TESTER(SIG C1D, E4255-E) . 005 C1D TESTER(SIG C1D, E4255-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4255-A) F72002MM ORIGIN: JP . PO NO.4514154656 SHIPDOC NO.1928314 HS CODE :9030.82 001 C1D TESTER(SIG C1D, E4255-B) 592-10475 ORIGIN: US . 002 C1D TESTER(SIG C1D, E4255-C) . 003 C1D TESTER(SIG C1D, E4255-D) . 004 C1D TESTER(SIG C1D, E4255-E) . 005 C1D TESTER(SIG C1D, E4255-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4255-A) F72002MM ORIGIN: JP . PO NO.4514154656 SHIPDOC NO.1928314 HS CODE :9030.82 001 C1D TESTER(SIG C1D, E4255-B) 592-10475 ORIGIN: US . 002 C1D TESTER(SIG C1D, E4255-C) . 003 C1D TESTER(SIG C1D, E4255-D) . 004 C1D TESTER(SIG C1D, E4255-E) . 005 C1D TESTER(SIG C1D, E4255-F) . 006 FULL AUTO PROBER (ACCRETECH UF3000EX, E4255-A) F72002MM ORIGIN: JP . PO NO.4514154656 SHIPDOC NO.1928314 HS CODE :9030.82 |
| 2024-10-24 |
NXGWTYOCPS39205 |
MICRON MEMORY JAPAN K K HIROSHIMA |
17738.0 kg |
903083
|
OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS |
| 2024-10-07 |
NXGWTYOCPA12834 |
MICRON MEMORY JAPAN K K HIROSHIMA |
17738.0 kg |
903083
|
OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS |
| 2024-02-13 |
KLLMNYC202312001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
1600.0 kg |
|
CHILLER ATS DEX-20A LONWORKS INV NO: 1826442 PO# 4513395030 |
| 2022-06-12 |
KLLMNYC202205001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
19998.0 kg |
846610
|
C1D TESTER 1238509 PROBER TOOL ID:FD8(10-3TEL_PRECIO_WLR) C1D TESTER 1172758 PROBER TOOL ID:F34SASA300 C1D TESTER 1172755 PROBER TOOL ID:F23SASA3EX C1D TESTER 1278167 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238511 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238509 PROBER TOOL ID:FD8(10-3TEL_PRECIO_WLR) C1D TESTER 1172758 PROBER TOOL ID:F34SASA300 C1D TESTER 1172755 PROBER TOOL ID:F23SASA3EX C1D TESTER 1278167 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238511 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238509 PROBER TOOL ID:FD8(10-3TEL_PRECIO_WLR) C1D TESTER 1172758 PROBER TOOL ID:F34SASA300 C1D TESTER 1172755 PROBER TOOL ID:F23SASA3EX C1D TESTER 1278167 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238511 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) |
| 2022-01-28 |
KLLMNYC202201001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
8234.0 kg |
290715
|
001 TEL DIFFUSION INDY B TOOL 001 TEL DIFFUSION INDY B TOOL |
| 2022-01-23 |
KLLMJP1085627 |
MICRON MEMORY JAPAN G K |
2320.0 kg |
|
001 DUALBEAM-HELIOS NANOLAB 460F1 . . |
| 2021-12-15 |
KLLMNYC202111002 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
9720.0 kg |
551431
|
DIFF HIKE_Q2LN_PLY_01BCD MICAP# 1216012 INV NO: 1563163 PO# 4510246741 DIFF HIKE_Q2LN_PLY_01BCD MICAP# 1216012 INV NO: 1563163 PO# 4510246741 DIFF HIKE_Q2LN_PLY_01BCD MICAP# 1216012 INV NO: 1563163 PO# 4510246741 |
| 2021-12-13 |
KLLMNYC202111001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
8756.0 kg |
293627
|
ACCRETECH PROBER UF3000 MT72-C MSIG TESTER WLR 6PIN 1172757 ACCRETECH PROBER UF3000EX C1D MSIG TESTER W;R 6PIN 1082601 MICAP# 11727771, 1172757, 1139324, 1154899 INV NO: 1563715 PO# 4508900124 ACCRETECH PROBER UF3000 MT72-C MSIG TESTER WLR 6PIN 1172757 ACCRETECH PROBER UF3000EX C1D MSIG TESTER W;R 6PIN 1082601 MICAP# 11727771, 1172757, 1139324, 1154899 INV NO: 1563715 PO# 4508900124 |
| 2021-11-21 |
KLLMJP1082138 |
MICRON MEMORY JAPAN G K |
1990.0 kg |
070920
|
001 15-3AMAT ADVTG2 PEN3VCENTURA AP ADVANTEDGE G2 ACAPK6UJ00 . . |
| 2021-11-19 |
KLLMJP1081915 |
MICRON MEMORY JAPAN G K |
2000.0 kg |
070920
|
001 15-3AMAT ADVTG2 PEN3VCENTURA AP ADVANTEDGE G2 ACAPK6UJ00 . . |
| 2021-11-14 |
KLLMJP1081914 |
MICRON MEMORY JAPAN G K |
5540.0 kg |
070920
|
001 15-3AMAT ADVTG2 PEN3VCENTURA AP ADVANTEDGE G2 ACAPK6UJ00 . . |
| 2021-08-28 |
KLLMNYC202107001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
7882.0 kg |
|
TEL INDY, MICAP 1216085, E0257 TEL INDY, MICAP 1216085, E0257 |
| 2021-07-19 |
KLLMNYC202106001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
13586.0 kg |
|
WET_TEL_TW WET_TEL_TW WET_TEL_TW WET_TEL_TW |
| 2021-06-23 |
KLLMJP1074819 |
MICRON MEMORY JAPAN G K |
2340.0 kg |
701790
|
001 DUALBEAM(SEM,FIB)ELECTRON MICROSCOPE . . . |